Education
- B.Tech.: Electrical Engineering, IIT Kanpur
- M.S.: Electrical and Computer Engineering, Iowa State University
- PhD.: Electrical and Computer Engineering, University of Minnesota, Twin-Cities (2010)
Thesis
Model Mismatch Paradigm for Probe based Nanoscale Imaging
Publications
9 total
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Multimode and multitone analysis of the dynamic mode operation of the Atomic Force Microscope
2013 · Conference · American Control Conference, pp:5506-5511
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Maximum-Likelihood Sequence Detector for Dynamic Mode High Density Probe Storage
2010 · Journal · IEEE Transactions on Communications
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High-speed Nano-imaging using dynamic mode AFM: A MAP detection approach
2010 · Conference · 44th Asilomar Conference on Signals, Systems and Computers
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Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy
2009 · Journal · Applied Physics Letters Vol. 95
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Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy
2009 · Journal · Review of Scientific Instruments
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Channel Modeling and Detector Design for Dynamic Mode High Density Probe Storage
2008 · Conference · 42nd Annual Conf. on Information Sciences and Systems (CISS)
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Modeling and identification of the dynamics of electrostatically actuated microcantilever with integrated thermal sensor,
2008 · Conference · 47th IEEE Conference on Decision and Control
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Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method
2007 · Conference · Proceedings of the 2007 American Control Conference, New York City, USA, July 11-13
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Real-time detection of probe loss in atomic force microscopy
2006 · Journal · Appl. Phys. Lett. 89