Alumnus · Left 2006
Deepak Sahoo
PhD. Alumnus
Currently: Associate Professor with tenure, Swansea University, UK
First employment after PhD: IBM Research Zurich
Education
- B.Tech.: Electrical Engineering, IIT, Kharagpur
- PhD.:Electrical and Computer Engineering, Iowa State University (2006)
Thesis
Transient force atomic force microscopy: systems approaches to emerging applications
Publications
11 total
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Modeling and identification of the dynamics of electrostatically actuated microcantilever with integrated thermal sensor,
2008 · Conference · 47th IEEE Conference on Decision and Control
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Transient Force Atomic Force Microscopy: A New Nano-Interrogation Method
2007 · Conference · Proceedings of the 2007 American Control Conference, New York City, USA, July 11-13
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Real-time detection of probe loss in atomic force microscopy
2006 · Journal · Appl. Phys. Lett. 89
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Harnessing the transient signals in atomic force microscopy
2005 · Journal · International Journal of Robust and Nonlinear Control, Special Issue on Nanotechnology and Micro-biology
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Observer based imaging methods for Atomic Force Microscopy,
2005 · Conference · Decision and Control
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Systems approach based Q-control and imaging in atomic force microscopy
2005 · Abstract / other · Scanning Probe Microscopy, Sensors and Nanostructures, Cancun, Mexico, June 5-8
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Transient Signal based sample-detection in Atomic Force Microscopy
2003 · Journal · Applied Physics Letters, 83(26)
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An Observer Based Sample Detection Scheme for Atomic Force Microscopy
2003 · Conference · 42nd IEEE Conference on Decision and Control
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Feedback Control theory for Real-time Scheduling
2002 · Conference · American Control Conference, col.2
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Transient Detection of Atomic Force Microscopy
2002 · Conference · Proceedings of the Allerton Conference, Urbana, Illinois, October
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Constructive control for quantum mechanical systems
2001 · Conference · IEEE Conference on Control and Decision Conference