Abstract / other · 2005
Systems approach based Q-control and imaging in atomic force microscopy
D. R. Sahoo, T. De, and M. V. Salapaka
Scanning Probe Microscopy, Sensors and Nanostructures, Cancun, Mexico, June 5-8
Abstract
Abstract not yet added for this entry.
BibTeX
@misc{sahoo-2005-systems-approach-based-q-control-and-imaging-in-atomic-force,
title = {Systems approach based Q-control and imaging in atomic force microscopy},
author = {D. R. Sahoo and T. De and M. V. Salapaka},
booktitle = {Scanning Probe Microscopy, Sensors and Nanostructures, Cancun, Mexico, June 5-8},
year = {2005}
}