Journal · 2008
Scanning Probe Microscopy – A Controls Systems Perspective on Nanointerrogation
Salapaka, Srinivasa M.; Salapaka, Murti V.
IEEE Control Systems Magazine 28, no. 2 (April 2008): 65–83.
Abstract
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BibTeX
@article{salapaka-2008-scanning-probe-microscopy-controls-systems-perspective,
title = {Scanning Probe Microscopy – A Controls Systems Perspective on Nanointerrogation},
author = {Salapaka and Srinivasa M.; Salapaka and Murti V.},
journal = {IEEE Control Systems Magazine 28, no. 2 (April 2008): 65–83.},
year = {2008},
doi = {10.1109/MCS.2007.914688}
}