Alumnus · Left 2004
Anil Gannepalli
PhD. Alumnus
Currently: Asylum Research, Santa Barbara
Education
- B.Tech.: Electrical Engineering, IIT Kharagpur
- PhD.:Electrical and Computer Engineering, Iowa State University (2004)
Thesis
Theoretical and Experimental Explorations in Atomic Force Microscopy
Publications
5 total
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Toward quantitative estimation of material properties with dynamic mode atomic force microscopy: a comparative study
2017 · Journal · Nanotechnology
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A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy,
2007 · Journal · IEEE Transactions on Control Systems Technology,
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Thermally driven non-contact atomic force microscopy
2005 · Journal · Applied Physics Letters, 87,(11)
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Amplitude Phase Dynamics and Fixed Points in Tapping-Mode Atomic Force Microscopy
2004 · Conference · pages: 2499-2504, Proceedings of the American Control Conference, Boston, Massachusetts, June 30 - July 2
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Thermal Noise Response Based Control of Tip-Sample Separation in an Atomic Force Microscope
2004 · Conference · Proceedings of the American Control Conference, Boston, Massachusetts, June 30 - July 2