Alumnus · Left 2004
Abu Sebastian
PhD. Alumnus
Currently: IBM Zurich Research Labs; IEEE Fellow
Education
- B.Tech.: Electrical Engineering, Bachelor of Technology: BITS, Pilani
- M.S.: Electrical and Computer Engineering, Iowa State University (1999)
- PhD.:Electrical and Computer Engineering, Iowa State University (2004)
Thesis
Nanotechnology: A systems and control approach
Publications
14 total
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Modeling and identification of the dynamics of electrostatically actuated microcantilever with integrated thermal sensor,
2008 · Conference · 47th IEEE Conference on Decision and Control
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A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy,
2007 · Journal · IEEE Transactions on Control Systems Technology,
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Thermally driven non-contact atomic force microscopy
2005 · Journal · Applied Physics Letters, 87,(11)
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Harnessing the transient signals in atomic force microscopy
2005 · Journal · International Journal of Robust and Nonlinear Control, Special Issue on Nanotechnology and Micro-biology
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Amplitude Phase Dynamics and Fixed Points in Tapping-Mode Atomic Force Microscopy
2004 · Conference · pages: 2499-2504, Proceedings of the American Control Conference, Boston, Massachusetts, June 30 - July 2
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Thermal Noise Response Based Control of Tip-Sample Separation in an Atomic Force Microscope
2004 · Conference · Proceedings of the American Control Conference, Boston, Massachusetts, June 30 - July 2
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System tools applied to micro-cantilever based devices
2003 · Book chapter · Multidisciplinary Research in Control: The Mohammed Dahleh Symposium 2002. Eds. L. Giarre' and B. Bamieh, Lecture Notes in Control and Information Sciences N. 289, Springer-Verlag, Berlin
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Transient Signal based sample-detection in Atomic Force Microscopy
2003 · Journal · Applied Physics Letters, 83(26)
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An Observer Based Sample Detection Scheme for Atomic Force Microscopy
2003 · Conference · 42nd IEEE Conference on Decision and Control
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High Bandwidth Nano-positioner: A Robust Control Approach
2002 · Journal · Review of Scientific Instruments
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Analysis of Periodic Solutions in Tapping Mode AFM
2002 · Conference · IEEE symposium on Mathematical Theory of Networks and Systems, University of Notredame, South Bend, Indiana, August 12
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Transient Detection of Atomic Force Microscopy
2002 · Conference · Proceedings of the Allerton Conference, Urbana, Illinois, October
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Design, Identification and Control of a Fast Nanopositioning Device
2002 · Conference · American Control Conference (ACC) 3 (May 2002): 1966–1971, Anchorage, Alaska.
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Harmonic and power balance tools for tapping-mode atomic force microscope
2001 · Journal · Journal of Applied Physics 89, no. 11 (June 2001): 6473–6480.