Custom Multi-Mode Atomic Force Microscopes
A suite of atomic force microscopes customized in-house for high-bandwidth, minimally-invasive imaging and quantitative material property measurement at the nanoscale. Includes derivatives of the Digital Instruments Multimode platform acquired in 1998 and subsequent modifications enabling Transient Force AFM, multi-frequency measurements, and real-time property determination.
Key specs
- Sub-Ångström vertical resolution demonstrated
- Sustained tip-sample separation control within nm scale for >30 minutes
- Real-time quantitative measurement of elasticity and dissipation
- Transient Force AFM mode invented in this lab
Available for external collaboration
This facility is available for use through sponsored research, consulting, or contract measurement engagements. For inquiries, contact murtis@umn.edu .
A photo of this facility will be added when the facilities folder is uploaded.